Материал: 18S20

Внимание! Если размещение файла нарушает Ваши авторские права, то обязательно сообщите нам

DS18S20

Related Application Notes

The following Application Notes can be applied to the DS18S20. These notes can be obtained from the Dallas Semiconductor “Application Note Book,” via our website at http://www.dalsemi.com/, or through our faxback service at (214) 450–0441.

Application Note 27: “Understanding and Using Cyclic Redundancy Checks with Dallas Semiconductor Touch Memory Product”

Application Note 55: “Extending the Contact Range of Touch Memories”

Application Note 74: “Reading and Writing Touch Memories via Serial Interfaces”

Application Note 104: “Minimalist Temperature Control Demo”

Application Note 105: “High Resolution Temperature Measurement with Dallas Direct–to–Direct Temperature Sensors”

Application Note 106: “Complex MicroLANs”

Application Note 108: “MicroLAN – In the Long Run”

Sample 1–Wire subroutines that can be used in conjunction with AN74 can be downloaded from the website or our Anonymous FTP Site.

MEMORY FUNCTION EXAMPLE Table 3

Example: Bus Master initiates temperature conversion, then reads temperature (parasite power assumed).

MASTER MODE

DATA (LSB FIRST)

COMMENTS

TX

Reset

Reset pulse (480-960 µs).

RX

Presence

Presence pulse.

TX

55h

Issue “Match ROM” command.

TX

<64-bit ROM code>

Issue address for DS18S20.

TX

44h

Issue “ Convert T” command.

TX

<I/O LINE HIGH>

I/O line is held high for at least 750 ms by bus master to

 

 

allow conversion to complete.

TX

Reset

Reset pulse.

RX

Presence

Presence pulse.

TX

55h

Issue “Match ROM” command.

TX

<64-bit ROM code>

Issue address for DS18S20.

TX

BEh

Issue “Read Scratchpad” command.

RX

<9 data bytes>

Read entire scratchpad plus CRC; the master now

 

 

recalculates the CRC of the eight data bytes received

 

 

from the scratchpad, compares the CRC calculated and

 

 

the CRC read. If they match, the master continues; if not,

 

 

this read operation is repeated.

TX

Reset

Reset pulse.

RX

Presence

Presence pulse, done.

21 of 27

DS18S20

MEMORY FUNCTION EXAMPLE Table 4

Example: Bus Master writes memory (parasite power and only one DS18S20 assumed).

MASTER MODE

DATA (LSB FIRST)

COMMENTS

TX

Reset

Reset pulse.

RX

Presence

Presence pulse.

TX

CCh

Skip ROM command.

TX

4Eh

Write Scratchpad command.

TX

<2 data bytes>

Writes 2 bytes to scratchpad (TH and TL).

TX

Reset

Reset pulse.

RX

Presence

Presence pulse.

TX

CCh

Skip ROM command.

TX

BEh

Read Scratchpad command.

RX

<9 data bytes>

Read entire scratchpad plus CRC. The master now

 

 

recalculates the CRC of the eight data bytes received

 

 

from the scratchpad, compares the CRC and the two

 

 

other bytes read back from the scratchpad. If data match,

 

 

the master continues; if not, repeat the sequence.

TX

Reset

Reset pulse.

RX

Presence

Presence pulse.

TX

CCh

Skip ROM command.

TX

48h

Copy Scratchpad command; after issuing this command,

 

 

the master must wait 10 ms for copy operation to

 

 

complete.

TX

Reset

Reset pulse.

RX

Presence

Presence pulse, done.

22 of 27

DS18S20

MEMORY FUNCTION EXAMPLE Table 5

Example: Temperature conversion and interpolation (external power supply and only one DS18S20 assumed.)

MASTER MODE

DATA (LSB FIRST)

COMMENTS

TX

Reset

Reset pulse.

TR

Presence

Presence pulse.

TX

CCh

Skip ROM command.

TX

44h

Convert T command.

RX

<1 data byte>

Read busy flag eight times. The master continues reading

 

 

1 byte (or bit) after another until the data is FFh (all bits

 

 

1).

TX

Reset

Reset pulse.

RX

Presence

Presence pulse.

TX

CCh

Skip ROM command.

TX

BEh

Read Scratchpad command.

RX

<9 data bytes>

Read entire scratchpad plus CRC. The master now

 

 

recalculates the CRC of the eight data bytes received

 

 

from the scratchpad and compares both CRCs. If the

 

 

CRCs match, the data is valid. The master saves the

 

 

temperature value and stores the contents of the count

 

 

register and count per °C register as COUNT_REMAIN

 

 

and COUNT_PER_C, respectively.

TX

Reset

Reset pulse.

RX

Presence

Presence pulse, done.

-

-

CPU calculates temperature as described in the data

 

 

sheet for higher resolution.

23 of 27

DS18S20

ABSOLUTE MAXIMUM RATINGS*

Voltage on Any Pin Relative to Ground

–0.5V to +6.0V

Operating Temperature

–55° C to +125° C

Storage Temperature

–55° C to +125° C

Soldering Temperature

260° C for 10 seconds

* This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability.

RECOMMENDED DC OPERATING CONDITIONS

PARAMETER

SYMBOL

CONDITION

MIN

TYP

MAX

UNITS

NOTES

Supply Voltage

VDD

Local Power

3.0

 

5.5

V

1

Data Pin

DQ

 

-0.3

 

VDD

V

1

Logic 1

VIH

 

2.2

 

VDD +0.3

V

1,2

Logic 0

VIL

 

-0.3

 

+0.8

V

1,3,7

DC ELECTRICAL CHARACTERISTICS

(-55°C to +125°C; VDD=3.0V to 5.5V)

PARAMETER

SYMBOL

CONDITION

MIN

TYP

MAX

UNITS

NOTES

Thermometer Error

tERR

-10°C to

 

 

 

±½

 

°C

 

 

 

+85°C

 

 

 

 

 

 

 

 

 

 

-55°C to

 

 

 

±2

 

 

 

 

 

 

+125°C

 

 

 

 

 

 

 

 

Input Logic High

VIH

Local Power

2.2

 

 

5.5

 

V

1,2

 

 

Parasite Power

3.0

 

 

 

 

V

1,2

Input Logic Low

VIL

 

-0.3

 

 

+0.8

 

V

1,3, 7

Sink Current

IL

VI/O=0.4V

-4.0

 

 

 

 

mA

1

Standby Current

IDDS

 

 

 

750

1000

 

nA

6,8

Active Current

IDD

 

 

 

1

1.5

 

mA

4

DQ Input Load Current

IDQ

 

 

 

5

 

 

µA

5

AC ELECTRICAL CHARACTERISTICS: NV MEMORY

 

 

 

 

 

 

 

 

(-55°C to +125°C; VDD=3.0V to 5.5V)

PARAMETER

SYMBOL

CONDITION

MIN

 

TYP

MAX

 

UNITS

 

NOTES

NV Write Cycle Time

tWR

 

 

 

2

10

 

ms

 

 

24 of 27

 

 

 

 

 

 

 

 

DS18S20

 

 

AC ELECTRICAL CHARACTERISTICS:

(-55°C to +125°C; VDD=3.0V to 5.5V)

 

 

 

 

 

 

 

PARAMETER

SYMBOL

CONDITION

MIN

TYP

MAX

UNITS

NOTES

 

 

Temperature Conversion

tCONV

 

 

200

750

ms

 

 

 

Time

 

 

 

 

 

 

 

 

 

Time Slot

tSLOT

 

60

 

120

µs

 

 

 

Recovery Time

tREC

 

1

 

 

µs

 

 

 

Write 0 Low Time

rLOW0

 

60

 

120

µs

 

 

 

Write 1 Low Time

tLOW1

 

1

 

15

µs

 

 

 

Read Data Valid

tRDV

 

 

 

15

µs

 

 

 

Reset Time High

tRSTH

 

480

 

 

µs

 

 

 

Reset Time Low

tRSTL

 

480

 

 

µs

9

 

 

Presence Detect High

tPDHIGH

 

15

 

60

µs

 

 

 

Presence Detect Low

tPDLOW

 

60

 

240

µs

 

 

 

Capacitance

CIN/OUT

 

 

 

25

pF

 

 

NOTES:

1.All voltages are referenced to ground.

2.Logic one voltages are specified at a source current of 1 mA.

3.Logic zero voltages are specified at a sink current of 4 mA.

4.Active current refers to either temperature conversion or writing to the E2 memory. Writing to E2 memory consumes approximately 200 A for up to 10 ms.

5.Input load is to ground.

6.Standby current specified up to 70° C. Standby current typically is 3 A at 125° C.

7.To always guarantee a presence pulse under low voltage parasite power conditions, VILMAX may have to be reduced to as much as 0.5V.

8.

To minimize IDDS, DQ should be GND ≤ DQ ≤ GND + 0.3V or VDD – 0.3V ≤ DQ ≤ VDD.

9.

Under parasite power, the max tRSTL before a power on reset occurs, is 960 ms.

25 of 27

Источник: https://studfile.net/preview/16504478/